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tools/testing/nvdimm: Populate dirty shutdown data

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Allow the unit tests to verify the retrieval of the dirty shutdown
count via smart commands, and allow the driver-load-time retrieval of
the smart health payload to be simulated by nfit_test.

Reviewed-by: Keith Busch <[email protected]>
Signed-off-by: Dan Williams <[email protected]>
This commit is contained in:
Dan Williams 2018-10-17 10:47:19 -07:00
commit f110176633
4 changed files with 16 additions and 3 deletions
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7
drivers/acpi/nfit/core.c
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@ -1721,7 +1721,7 @@ static bool acpi_nvdimm_has_method(struct acpi_device *adev, char *method)
return false;
}
static void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
__weak void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
{
struct nd_intel_smart smart = { 0 };
union acpi_object in_buf = {
@ -1785,8 +1785,11 @@ static int acpi_nfit_add_dimm(struct acpi_nfit_desc *acpi_desc,
nfit_mem->dsm_mask = acpi_desc->dimm_cmd_force_en;
nfit_mem->family = NVDIMM_FAMILY_INTEL;
adev = to_acpi_dev(acpi_desc);
if (!adev)
if (!adev) {
/* unit test case */
populate_shutdown_status(nfit_mem);
return 0;
}
adev_dimm = acpi_find_child_device(adev, device_handle, false);
nfit_mem->adev = adev_dimm;